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--- afm:relevant_papers [2007/10/04 10:11] – beker
+++ afm:relevant_papers [2012/08/14 11:43] (current) – galli
@@ Line 1: / Line 1: @@
+====== Paper repository of the Bio SPM Lab ======
+Upload here papers relevant to the research done in the Bio SPM Lab. You should upload the files to the namespace (directory) [[http://msm09.physics.leidenuniv.nl/dokuwiki/lib/exe/media.php?ns=biospmlab:papers|biospmlab/papers]]. Make a new session when needed.\\
+Note that some people might collaborate with the MSM group. This group has also a large paper repository [[http://msm09.physics.leidenuniv.nl/dokuwiki/doku.php?id=relevant_literature_new|here]] that might interest you, also with SPM articles (some of them imported here).
+===== SPM/technique =====
+*C. H. Yang and T. H. Chang, M. J. Yang, W. J. Moore \\
+//A low noise transimpedance amplifier for cryogenically cooled quartz tuning fork force sensors// \\
+Rev. Sci. Instr. **73**, 2713 (2002)\\
+{{relevant_lit:revsciinstrum_73_2713.pdf}}
+*Hal Edwards, Larry Taylor, and Walter Duncan, Allan J. Melmed\\
+//Fast, high-resolution atomic force microscopy using a quartz tuning fork
+as actuator and sensor// \\
+J. Appl. Phys. **82**, 980 (1997)\\
+{{relevant_lit:japplphys_82_980.pdf}}
+*Franz J. Giessibl\\
+//Atomic resolution on Si(111)-(7�7) by noncontact atomic force microscopy with a force sensor based on a quartz tuning fork// \\
+Appl. Phys. Lett. **76**, 1470 (2000)\\
+{{relevant_lit:applphyslett_76_1470.pdf}}
+*Franz J. Giessibl\\
+//High-speed force sensor for force microscopy and profilometry utilizing a quartz tuning fork// \\
+Appl. Phys. Lett. **73**, 3956 (1998)\\
+{{relevant_lit:applphyslett_73_3956.pdf}}
+*Christine Meyer, Omar Sqalli, Heribert Lorenz, and Khaled Karrai\\
+//Slip-stick step-scanner for scanning probe microscopy// \\
+Rev. Sci. Instr. **76**, 063706 (2005)\\
+{{relevant_lit:05_09_meyer_revsciinstrum.pdf}}
+*Georg E. Fantner,a! Paul Hegarty, Johannes H. Kindt, Georg Schitter,
+Geraldo A. G. Cidade, and Paul K. Hansma\\
+//Data acquisition system for high speed atomic force microscopy//\\
+Rev. Sci. Instr. **76**, 026118 (2005)\\
+{{biospmlab:papers:rsi76-026118.pdf}}
+*Paul K. Hansma, Georg Schitter, Georg E. Fantner, Craig Prater\\
+//High-Speed Atomic Force Microscopy//\\
+Science **314**, 601 (2006)\\
+{{biospmlab:papers:ap-science-314-601.pdf}}
+*Georg E. Fantnera,, Georg Schittera,1, Johannes H. Kindta,1, Tzvetan Ivanovb,1,
+Katarina Ivanovab, Rohan Patela, Niels Holten-Andersenc, Jonathan Adamsa,
+Philipp J. Thurnera, Ivo W. Rangelowb, Paul K. Hansmaa\\
+//Components for high speed atomic force microscopy//\\
+Ultramicroscopy **106** (2006) 881–887\\
+{{biospmlab:papers:ultramicroscopy-106-881.pdf}}
+*M.J.Rost et al.\\
+//Scanning probe microscopes go video rate and beyond//\\
+Rev. Sci. Instr. **76**, 053710 (2005)\\
+{{biospmlab:papers:rsi-76-053710.pdf}}
+*Wilhelm Melitz, Jian Shen, Andrew C. Kummel, Sangyeob Lee\\
+//Kelvin Probe Microscopy and its Applications//\\
+Surface Science Reports **66**, 1-27 (2011)\\
+{{afm:skpm-review.pdf}}
+===== AFM with Carbon nanotube tips =====
+*//Imaging artefacts in atomic force microscopy with carbon nanotube tips//\\
+M C Strus, A Raman, C-S Han and CV Nguyen\\
+Nanotechnology **16** (2005) 2482–2492\\
+{{biospmlab:papers:nanotechnology2005_strus_nguyen_imagingartefactsafmwithcnt.pdf}}