Differences

This shows you the differences between two versions of the page.

--- afm_room_626_magnetic_force_microscopy [2008/04/21 09:05] – verstoep
+++ afm_room_626_magnetic_force_microscopy [2008/04/21 09:11] (current) – verstoep
@@ Line 8: / Line 8: @@
 The tip is then raised just above the sample surface. The surface is scanned while being monitored for the influence of magnetic forces. These influences are measured using the principle of force gradient detection. In
 the absence of magnetic forces, the cantilever has a resonant frequency. This frequency is shifted by a small amount proportional to vertical gradients in the magnetic forces on the tip. The shifts in resonant frequency tend to be very small, typically in the range 1-40 Hz for cantilevers having a resonant frequency  ~75 kHz.
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 (version july 2007)
-The cantilever should be mounted as described in the [[http://msm24.physics.leidenuniv.nl/dokuwiki/doku.php?id=afm:equipment_manuals|contact mode manual "multimode-manual-revb.pdf"]]. The cantilever holder should be suited for tapping mode. For adjustment of the laser, settings of the lockin amplifier etc. look into the tapping mode manual. The tip should have a magnetic coating and will have to be magnetized in the proper direction before use.
+The cantilever should be mounted as described in the [[afm:equipment_manuals|contact mode manual]] "{{afm:multimode-manual-revb.pdf|multimode-manual-revb.pdf}}". The cantilever holder should be suited for tapping mode. For adjustment of the laser, settings of the lockin amplifier etc. look into the tapping mode manual. The tip should have a magnetic coating and will have to be magnetized in the proper direction before use.
 Tip magnetization is done in the following way:
 Instead of a sample, a NdFeB magnet disc with the field perpendicular to the surface is mounted on the scanner. Approach the tip in the "contact mode" manner. After touching the surface retract the tip, remove the NdFeB magnet and mount your sample.