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--- siemens_d5005_reflectometry [2007/08/24 11:29] – hendrikx
+++ siemens_d5005_reflectometry [2007/08/29 12:22] (current) – hendrikx
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+Siemens D5005, measurement of thin film thickness using Xray reflectometry. \\
+{{data:d5005_03.pdf}}
+The Siemens D5005 x-ray diffractometer makes use of very narrow collimated x-ray beams of high intensity. Exposure of the eyes or the skin of the body to the primary x-ray beam may result in severe radiation burns in a matter of seconds. Never try to bypass the electrical safety circuit!  In case of malfunctions, call Bruker-AXS in Delft.
+Oostsingel 209 \\
+HL Delft, the Netherlands \\
+Tel:     +31 (0)15 2152593 \\
+Fax:     +31 (0)15 2152599 \\
+Email:   service@bruker-axs.nl
+For more information regarding radiation safety, contact the radiation expert: \\
+Marc Fluttert \\
+Gorlaeus lab, HB106 \\
+/ 4566
+fluttert@science.leidenuniv.nl