The Scanning Probe Microscopy User Facility (HL 701-702) is a shared facility of Leiden Institute of Physics (LION), available to the rest of the Leiden University under request. We can also offer some support for academy and industry outside Leiden University. Contact person and facility manager is Dr. Federica Galli, contact information is here. The facility provides the following microscopes:

1 JPK Nanowizard 3 Ultra Speed AFM/STM,
1 JPK Nanowizard 4 AFM,
1 Bruker Multimode AFM/STM with Nanoscope V controller,
1 Bruker Multimode AFM/STM with Nanoscope IIIA controller,
1 Open Source STM (Multimode with SoftdB MK2 Controller)

The microscopes allow a versatile set of SPM modes/measurements: STM, Contact AFM, Tapping AFM, Current Sensing AFM, Electric Force Microscopy, Magnetic Force Microscopy, Surface Potential, Peak Force AFM, PF-Tunneling AFM, Piezo Force Microscopy, Quantitative Nanomechanical Property Mapping, Quantitative Imaging (JPK), High speed imaging (JPK), closed loop operation (JPK) and Nanolithography (JPK). All these modes are possible in air AND in liquid. Several accessories are available: cooling/heating stage, EC cell, environemental chamber.

• Manuals and generic SPM documentation (wiki) (Password required).
  

• Equipment reservation.
  

• Important regulations and safety related rules. Mandatory for all SPM lab users!
  

• Contact information here.