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| afm:start [2017/01/12 15:28] – [Welcome to the LION SPM User Facility] galli | afm:start [2021/07/26 19:19] (current) – external edit 127.0.0.1 |
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| ====== Welcome to the LION SPM User Facility ====== | ====== Welcome to the LION Scanning Probe Microscopy Facility ====== |
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| The LION Scanning Probe Microscopy User Facility is a shared facility of LION, available to the rest of the Leiden University under request. We can also offer some support for academy and industry outside Leiden University. Contact LION staff for this [[afm:about|here]]. It provides the following microscopes:\\ | The Scanning Probe Microscopy User Facility is a shared laboratory of the Leiden Institute of Physics (LION) providing Atomic Force Microscopes with several measurement options (like STM) . It is available to the rest of the Leiden University under request. We can also offer some support for academy and industry outside the Leiden University. Contact person and facility manager is Dr. Federica Galli, contact information is [[afm:about|here]]. The facility provides the following microscopes:\\ |
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| 1 JPK Nanowizard Ultra Speed AFM/STM, \\ | 1 JPK Nanowizard 3 Ultra Speed AFM/STM, \\ |
| 1 Multimode AFM/STM from Digital Instruments (Veeco),\\ | 1 JPK Nanowizard 4 AFM, \\ |
| 1 upgraded Multimode AFM/STM from Bruker,\\ | 1 Bruker Multimode AFM/STM with Nanoscope V controller,\\ |
| 1 Open Source AFM/STM (Multimode+SoftdB Controller) (Comig soon!)\\ | 1 Bruker Multimode AFM/STM with Nanoscope IIIA controller,\\ |
| | 1 "Development" STM (Multimode with SoftdB MK2 Controller)\\ |
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| The microscopes allow a versatile set of SPM modes/measurements: STM, Contact AFM, Tapping AFM, Current Sensing AFM, Electric Force Microscopy, Magnetic Force Microscopy, Surface Potential, Peak Force AFM, PF-Tunneling AFM, Piezo Force Microscopy, Quantitative Nanomechanical Property Mapping, Quantitative Imaging (JPK), High speed imaging (JPK), closed loop operation (JPK) and Nanolithography (JPK). All these modes are possible in air AND in liquid. Several accessories are available: cooling/heating stage, EC cell, environemental chamber.\\ | {{afm:img_1367.jpg?1500}}\\ |
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| | The microscopes allow a versatile set of SPM modes/measurements: STM, Contact AFM, Tapping AFM, Current Sensing AFM, Electric Force Microscopy, Magnetic Force Microscopy, Surface Potential, Peak Force AFM, PF-Tunneling AFM, Piezo Force Microscopy, Quantitative Nanomechanical Property Mapping, Quantitative Imaging (JPK),Advanced Quantitative Imaging (JPK), High speed imaging (JPK), closed loop operation (JPK) and Nanolithography (JPK). All these modes are possible in air AND in liquid. Several accessories are available: cooling/heating stage, EC cell, environmental chamber.\\ |
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| * Manuals and generic SPM documentation ([[afm:wiki|wiki]]) (Password required)\\ | |
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| * Equipment [[http://bioafm.physics.leidenuniv.nl/reservations/|reservation]].\\ | * Manuals and generic SPM documentation ([[afm:wiki|wiki]]) (Password required).\\ |
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| | * Equipment [[https://www.physics.leidenuniv.nl/booked/Web/|reservation]].\\ |
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| * Important [[afm:safety_and_lab_regulations|regulations and safety related rules]]. Mandatory for all SPM lab users!\\ | * Important [[afm:safety_and_lab_regulations|regulations and safety related rules]]. Mandatory for all SPM lab users!\\ |
